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Conference papers

Raman and PAS Characterization of Electron Irradiated UO2 to Determine U Displacement Threshold

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https://hal-univ-orleans.archives-ouvertes.fr/hal-03561789
Contributor : Marie-France Barthe Connect in order to contact the contributor
Submitted on : Tuesday, February 8, 2022 - 2:47:16 PM
Last modification on : Thursday, February 10, 2022 - 3:30:16 AM

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  • HAL Id : hal-03561789, version 1

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M.F. Barthe, Lionel Desgranges, Ritesh Mohun, Pierre Desgardin, Patrick Simon, et al.. Raman and PAS Characterization of Electron Irradiated UO2 to Determine U Displacement Threshold. TMS 2017 146th Annual Meeting and Exhibition, Feb 2017, San Diego, United States. ⟨hal-03561789⟩

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