Raman and PAS Characterization of Electron Irradiated UO2 to Determine U Displacement Threshold - Archive ouverte HAL Access content directly
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Raman and PAS Characterization of Electron Irradiated UO2 to Determine U Displacement Threshold

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Chemical Sciences Material chemistry

Marie-France Barthe  : Connect in order to contact the contributor

https://hal-univ-orleans.archives-ouvertes.fr/hal-03561789

Submitted on : Tuesday, February 8, 2022-2:47:16 PM

Last modification on : Friday, January 6, 2023-4:01:16 AM

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hal-03561789 , version 1 (08-02-2022)

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  • HAL Id : hal-03561789 , version 1

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M.F. Barthe, Lionel Desgranges, Ritesh Mohun, Pierre Desgardin, Patrick Simon, et al.. Raman and PAS Characterization of Electron Irradiated UO2 to Determine U Displacement Threshold. TMS 2017 146th Annual Meeting and Exhibition, Feb 2017, San Diego, United States. ⟨hal-03561789⟩

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CEA X CNRS UNIV-ORLEANS CEMHTI X-LSI X-DEP-PHYS DEN INC-CNRS CEA-UPSAY UNIV-PARIS-SACLAY DEN-CAD CEA-CAD DEN-SACLAY GS-ENGINEERING IRAMIS GS-PHYSIQUE
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