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Raman and PAS Characterization of Electron Irradiated UO2 to Determine U Displacement Threshold

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hal-03561789 , version 1 (08-02-2022)

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  • HAL Id : hal-03561789 , version 1

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M.F. Barthe, Lionel Desgranges, Ritesh Mohun, Pierre Desgardin, Patrick Simon, et al.. Raman and PAS Characterization of Electron Irradiated UO2 to Determine U Displacement Threshold. TMS 2017 146th Annual Meeting and Exhibition, Feb 2017, San Diego, United States. ⟨hal-03561789⟩
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