Cross section Calibration Silicon Cryptography Circuit testing Sensors Random access memory Computer architecture Neutron Cryptographie MEMS Fault modeling Analytical models Clocks Low-power design AES DFT Simulation Soft errors Hardware RSA Cross-section Radiation Voltage Magnetic tunneling Atmospheric neutrons Accelerometer Testing MRAM Estimation SoC Transistors Monitoring Single event upset SEU Fault attacks CMOS Test Resistive-open defects Through-silicon vias Design Core-cell Fiabilité Electromagnetic Analysis Memory test Integrated circuit testing Integrated circuit design SRAM Hardware security DPA Automatic test pattern generation Embedded systems Logic testing Testability Flip-flops Thermal sensor Memory device Noise Spintronics Neutrons Variability Libraries Power demand Transient faults SEU Robustness Reliability Multiple cell upset MCU Power consumption CMOS integrated circuits Modeling Fault tolerance Low power ATPG Fault injection Countermeasures Integrated circuit modeling Circuit faults Field programmable gate arrays Design space exploration Memories Accelerometers Security Crosstalk VLSI Memory Delays Switches Logic gates Hardware Trojan Heavy ions Microprocessors Failure analysis Integrated circuit interconnections SER FPGA Single Event Upset Heating Diagnostic Delay testing BIST