Metallization of warm dense SiO$_2$ studied by XANES spectroscopy - Tout INSP Accéder directement au contenu
Article Dans Une Revue Physical Review Letters Année : 2014

Metallization of warm dense SiO$_2$ studied by XANES spectroscopy

Résumé

We investigate the evolution of the electronic structure of fused silica in a dense plasma regime using time-resolved x-ray absorption spectroscopy. We use a nanosecond (ns) laser beam to generate a strong uniform shock wave in the sample and a picosecond (ps) pulse to produce a broadband x-ray source near the Si $K$ edge. By varying the delay between the two laser beams and the intensity of the ns beam, we explore a large thermodynamical domain with densities varying from 1 to 5 g/cm$^3$ and temperatures up to 5 eV. In contrast to normal conditions where silica is a well-known insulator with a wide band gap of 8.9 eV, we find that shocked silica exhibits a pseudogap as a semimetal throughout this thermodynamical domain. This is in quantitative agreement with density functional theory predictions performed using the generalized gradient approximation.
Fichier principal
Vignette du fichier
denoeud2014.pdf (730.81 Ko) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte

Dates et versions

hal-01561842 , version 1 (12-01-2022)

Licence

Paternité

Identifiants

Citer

A. Denoeud, A. Benuzzi-Mounaix, A. Ravasio, F. Dorchies, P. M. Leguay, et al.. Metallization of warm dense SiO$_2$ studied by XANES spectroscopy. Physical Review Letters, 2014, 113 (11), pp.116404. ⟨10.1103/PhysRevLett.113.116404⟩. ⟨hal-01561842⟩
230 Consultations
44 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More